Mathematical analysis reveals temperature effects on electrical properties in GaAs/Si heterojunctions, suggesting performance optimization.
In this study the electrical properties of the GaAs/Si radial heterojunction by measuring them at various temperatures of 50 K to 500 K separated by 50 K at a time and considering the values of band gap narrowing (BGN), built-in potential, band gap difference between GaAs and Si, capacitance-voltage (C-voltage) curves. Precisely, we study shell radii 500 nm and 1000 nm in the structure. We find that the thickness of the depletion region of the GaAs/Si radial heterojunction increases with temperature. The BGN decreases by 2 meV as the doping concentration changes by 2∙10-1 to 2∙10-2. Furthermore, the capacity power charge of the GaAs/Si radial heterojunction rises by 3 nF with hike in temperature between 50 K and 500 K. The inherent potential of the GaAs/Si radial heterojunction reduces by 1.5 volts with rise in temperature.
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Abduraimov et al. (2026) studied this question.
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