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The aim is to analyze L-shell X-ray fluorescence in elements ranging from atomic number 42 to 83 and refine related theoretical models.

Investigation of L-Shell Fluorescence Emission in 42 ≤ Z ≤ 83 Elements Using Reflection Geometry and Low Energetic Au L X-rays

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The aim is to analyze L-shell X-ray fluorescence in elements ranging from atomic number 42 to 83 and refine related theoretical models.
L-shell X-ray fluorescence measured using a Si-PIN detector
Reflection geometry applied for fluorescence measurement
Low energetic Au L-X-rays used for excitation
Fluorescence cross sections and yields estimated from data
Intensity ratios calculated for emitted X-ray lines
L-shell fluorescence parameters measured for elements with 42≤Z≤83
Experimental results compared with theoretical data
Average L-fluorescence yield calculated and compared with existing literature
Observations indicate complexity in electronic transitions

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Investigation reveals fluorescence parameters in elements 42 to 83, suggesting refinements to X-ray analysis techniques.

Manoj et al. (2026) studied this question.

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