This review demonstrates electron microscopy techniques to analyze adhesion interfaces and their mechanisms, indicating their significance in material science.
This article reviews the imaging and analyzing techniques of adhesion interfaces by electron microscopy to study the mechanism behind the adhesion phenomena. The electron microscopic techniques that are featured in this article are energy-filtering transmission electron microscopy（EFTEM）, scanning transmission electron microscopy（STEM） and low-voltage scanning electron microscopy（LV-SEM）. Adhesion interfaces are characterized by STEM combined with energy dispersive X-ray spectrometry（EDX） and electron energy loss spectroscopy（EELS）. STEM-EDX allowed us to perform local elemental analysis and mapping in nanometer scale, while STEM-EELS provide us information on chemical structures included in the small regions of interest. Specimen preparation techniques for EFTEM and STEM are also shown to obtain thin cross sections of interfacial regions by ultramicrotomy. High-resolution LV-SEM gives us surface topographic features with nanometer scale formed by disentanglement of polymer chains at adhesive interfaces. This fractographic investigation allows us to study the entanglement of polymer chains at interfaces.
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Shin Horiuchi (2019) studied this question.
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