Thermal Aging-Induced Evolution of Surface Charge Dynamics in Al2O3-Doped Epoxy Resin Insulators for GIS/GIL

Thermal stress is an important factor affecting the long-term performance of solid insulation in GIS/GIL, and the physicochemical properties of insulating materials play a crucial role in governing surface charge dynamics. This study investigates the influence of accelerated thermal aging on the surface charge behavior of Al2O3-doped epoxy resin insulators. Different aging severities were applied to simulate long-term service conditions, and charge accumulation and dissipation characteristics were correlated with physicochemical evolution revealed by scanning electron microscopy (SEM) and Fourier transform infrared spectroscopy (FTIR). The results indicate that increasing aging severity reduces the charge accumulation rate while increasing the saturated surface charge density. Voltage polarity significantly influences surface charge behavior: a relatively uniform distribution is observed under positive polarity, whereas localized charge clusters are more likely to form under negative polarity. Thermal aging also accelerates the development of surface defects and increases polar functional groups, resulting in degraded insulating performance. These findings clarify the relationship between thermal aging, physicochemical evolution, and surface charge dynamics in epoxy-based insulation systems.