A Two-Level Illumination Correction Network for Digital Meter Reading Recognition in Non-Uniform Low-Light Conditions

The automatic reading recognition of digital instruments is crucial for achieving metering automation and intelligent inspection. However, in non-standardized industrial environments, the masking effect caused by the coupling of non-uniform low-light conditions and the reflective surfaces of instrument panels severely degrades the displayed information, significantly limiting the recognition performance. Conventional image processing methods, while aiming to restore the imaging quality of instrument panels through low-light enhancement, inevitably introduce overexposure and indiscriminately amplify background noise during this process. To address the two key challenges of illumination recovery and noise suppression in the process of restoring panel image quality under non-uniform low-light conditions, this paper proposes a coarse-to-fine cascaded perception framework (CFCP). First, a lightweight YOLOv10 detector is employed to coarsely localize the meter reading region under non-uniform illumination conditions. Second, an Adaptive Illumination Correction Module (AICM) is designed to decouple and correct the illumination component at the pixel level, effectively restoring details in dark areas. Then, an Illumination-invariant Feature Perception Module (IFPM) is embedded at the feature level to dynamically perceive illumination-invariant features and filter out noise interference. Finally, the refined detection results are fed into a lightweight sequence recognition network to obtain the final meter readings. Experiments on a self-built industrial digital instrument dataset show that the proposed method achieves 93.2% recognition accuracy, with 17.1 ms latency and only 7.9 M parameters.