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An experimental method analyzes waveguide couplers in THz devices, suggesting a faster alternative to traditional methods.
The development of next-generation terahertz (THz) transmitters and receivers based on 3D stacked packaging technology relies heavily on the integration of high-performance waveguide directional couplers. This paper presents an accurate and efficient method based on the mode-matching method (MMM) for the rapid analysis of a branch waveguide coupler fabricated through a silicon-based 3D stacking process. In contrast to the traditional method using the finite-element method (FEM) in HFSS, which is cumbersome and time-consuming, the proposed method offers orders-of-magnitude speed improvement. It is especially well-suited for large-scale uncertainty error analysis and statistical evaluation of THz waveguide couplers and related components. This theoretical MMM is validated through an experiment by characterizing a deep reactive ion etching (DRIE) fabricated and 3D stacked 220 GHz waveguide coupler.
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Li et al. (2026) studied this question.
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