Demonstrates accurate temperature measurement during diamond growth in a microwave plasma reactor, highlighting the method's advantages.
We report the Raman spectrum measurement of a diamond single crystal during epitaxial growth in a microwave plasma reactor in a hydrogen‒methane mixture at various temperatures of the substrate. The crystal temperature is determined from the shift of the first-order Raman peak in the spectrum. It is shown that, compared to pyrometric methods, in situ Raman scattering enables more accurate measurement of the substrate temperature, which is critical for monitoring the CVD diamond synthesis process.
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Yurov et al. (2026) studied this question.
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