Demonstrates a novel method to improve accuracy in measuring domain wall dynamics in thin magnetic films, highlighting its importance.
To measure nonuniversal parameters of domain wall dynamics in thin magnetic films, authors developed an instrument that, in conjunction with a microscope utilizing the magneto-optical Kerr effect, enables the study of domain wall dynamics at velocities two to three orders of magnitude higher than those measurable with a standard electromagnet. For processing measurement results obtained using arbitrary-shaped magnetic field pulses, a mathematical correction method was developed and successfully implemented in software. A comparison of the nonuniversal parameters of the domain wall creep regime, derived from raw data versus corrected data using this mathematical method, demonstrated the necessity of its application to improve the accuracy of the determined parameters.
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Pashenko et al. (2025) studied this question.
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