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April 28, 1988Electronics Letters

New method for the extraction of MOSFET parameters

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Authors

GGG. GhibaudoON Semiconductor (United States)

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G. Ghibaudo (1988) studied this question.

synapsesocial.com/papers/69d6c86afca0359822aa87cfhttps://doi.org/10.1049/el:19880369
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  1. 1A new AC measurement technique to accurately determine MOSFET constants1984 · 8 citations
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