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January 1, 2005Journal of Research of the National Institute of Standards and TechnologyOpen Access

Slip correction measurements of certified PSL nanoparticles using a nanometer differential mobility analyzer (nano-DMA) for Knudsen number from 0.5 to 83

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JKJ.H. KimUniversity of MinnesotaGMGeorge W. MulhollandNational Institute of Standards and TechnologySKS R. KukuckNational Institute of Standards and Technology

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Kim et al. (2005) studied this question.

synapsesocial.com/papers/69d790efb4cef8fedc4900cdhttps://doi.org/10.6028/jres.110.005
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