Optical sectioning lattice structured illumination microscopy (OS-LSIM)

Optical sectioning structured illumination microscopy (OS-SIM) is a high-speed, minimally invasive, three-dimensional imaging microscopic technique, playing an important role in life science. However, OS-SIM is unable to achieve optical sectioning and isotropic super-resolution simultaneously. To tackle this drawback, we propose and demonstrate herein optical sectioning lattice structured illumination microscopy (OS-LSIM). This method utilizes a digital micro-mirror device to generate two-dimensional lattice patterns and a lock-in based reconstruction algorithm to realize both optical sectioning and spatial resolution enhancement. OS-LSIM features an axial resolution (optical sectioning strength) of 688 ± 16 nm and a lateral resolution improvement factor of 1.79 compared to conventional wide-field microscopy. We anticipate that OS-LSIM will open new avenues for the study of cellular dynamics in life science.