Implementing Realistic Heavy Ion Tracks in a SEE Prediction Tool: Comparison Between Different Approaches

Different radial ionization profiles modeling approaches are compared for the energy deposition representation in a single event effects (SEE) prediction tool. The total SEU cross-section calculated with the different approaches is compared for different SOI and bulk technologies, along with the multiple bit upset (MBU) prediction. A “refined average” approach is identified as a good trade-off for implementation in an engineer SEE prediction tool, taking into account sufficiently detailed physics, without asking for too much computer resources.