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November 1, 1971Physical Review Letters

New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure

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Authors

DSD. E. SayersIndiana University School of MedicineESEdward A. SternBar-Ilan UniversityFLFarrel W. LytleBoeing (United States)

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Sayers et al. (1971) studied this question.

synapsesocial.com/papers/69d927ae16f0d2beeba3c251https://doi.org/10.1103/physrevlett.27.1204
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