What question did this study set out to answer?

Investigate electric field strength singularities at sharp metallization edges on dielectric substrates and resolve grid-size dependence in numerical simulations.

February 1, 2015IEEE Transactions on Dielectrics and Electrical Insulation

Simulation of the electric field strength in the vicinity of metallization edges on dielectric substrates

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Authors

CBChristoph Friedrich BayerSchott (Germany)EBEberhard BaerSchott (Germany)UWUwe WaltrichFraunhofer Institute for Integrated Systems and Device Technology

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Implication

Simulation study demonstrates mesh-independent electric field peaks near metallization edges in power modules, indicating dielectric conductivity ratios determine maximum stress.

Key Points

Investigate electric field strength singularities at sharp metallization edges on dielectric substrates and resolve grid-size dependence in numerical simulations.
Developed a mesh-independent evaluation procedure to quantify electric field strengths near sharp edges without virtual radius suppression artifacts.
Conducted electrostatic and electric transient simulations evaluating metallization layer offsets, layer thicknesses, electrode geometries, and dielectric material properties.
The mesh-independent evaluation technique successfully enabled quantitative assessment of electric field strengths directly adjacent to sharp metallization edges.
Electric transient simulations revealed that the ratio of conductivities of the involved dielectric materials plays a major role in determining maximum field strength.

Cite This Study

Bayer et al. (2015) studied this question.

synapsesocial.com/papers/69dbdc415b363cdf1c836144 https://doi.org/10.1109/tdei.2014.004285

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Implication

Simulation study demonstrates mesh-independent electric field peaks near metallization edges in power modules, indicating dielectric conductivity ratios determine maximum stress.

Simulation of the electric field strength in the vicinity of metallization edges on dielectric substrates

Discussion

Member takes

Implication

Key Points

Cite This Study

Simulation of the electric field strength in the vicinity of metallization edges on dielectric substrates

Discussion

Member takes

Implication

Key Points

Cite This Study

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