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May 1, 2004IEEE Transactions on Electron Devices

Low-field amorphous state resistance and threshold voltage drift in chalcogenide materials

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Authors

APA. PirovanoMicron (Italy)ALAndrea L. LacaitaPolitecnico di MilanoFPF. PellizzerMicron (United States)

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Pirovano et al. (2004) studied this question.

synapsesocial.com/papers/69dc69a74264bdb384359447https://doi.org/10.1109/ted.2004.825805
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