Careful examination of x‐ray diffraction patterns from melt‐crystallized nylon 11 films show significant discrepancies with the proposed α‐form structure. These discrepancies do not disappear after the samples have been annealed. The temperature dependence of the d spacings of the two strongest peaks show further evidence that the melt‐crystallized and solution‐cast films (α form) possess different crystal structures. These results suggest a different crystal structure for the melt‐crystallized films; this would help explain the rather low piezoelectric response of these films and also the failure to observe a rapid decrease in polarization at the transition temperature.
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Kim et al. (1985) studied this question.
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