What question did this study set out to answer?

To develop a simple in situ technique for measuring pulsed Gaussian-beam spot sizes, particularly for tightly focused beams, and calibrate laser-induced effect thresholds.

May 1, 1982Optics Letters

Simple technique for measurements of pulsed Gaussian-beam spot sizes

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Authors

JLJ. M. LiuHoward Hughes Medical Institute

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Implication

Experimental study demonstrates in situ spot size measurement for pulsed Gaussian beams, indicating precise fluence calibration for laser-induced silicon phase transformations.

Key Points

To develop a simple in situ technique for measuring pulsed Gaussian-beam spot sizes, particularly for tightly focused beams, and calibrate laser-induced effect thresholds.
Implemented an in situ optical measurement approach tailored for highly focused pulsed Gaussian laser beam spots.
Applied the method to calibrate absolute threshold-energy fluences during picosecond-laser-induced phase transformations on silicon-crystal surfaces.
Enabled direct characterization of tightly focused pulsed Gaussian-beam spot dimensions in situ without external profiling equipment.
Successfully established absolute threshold-energy fluences for multiple picosecond-laser-induced phase transformations on crystalline silicon.

Cite This Study

J. M. Liu (1982) studied this question.

synapsesocial.com/papers/69e8811cf20983b8aefae625 https://doi.org/10.1364/ol.7.000196

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Implication

Experimental study demonstrates in situ spot size measurement for pulsed Gaussian beams, indicating precise fluence calibration for laser-induced silicon phase transformations.

Simple technique for measurements of pulsed Gaussian-beam spot sizes

Discussion

Member takes

Implication

Key Points

Cite This Study

Simple technique for measurements of pulsed Gaussian-beam spot sizes

Discussion

Member takes

Implication

Key Points

Cite This Study

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