Detecting changes in the permittivities of materials has important applications in electronic information, materials science, biomedicine, and many other fields. However, existing detection methods are limited by factors such as sample thickness and resonance intensity, making it difficult to achieve sensitive dielectric constant detection at desired frequency bands. This paper proposes a method for detecting the dielectric constant changes in samples based on destructive interference of spoof surface plasmon polaritons (SSPPs) in a dual-path transmission structure, which forms a characteristic absorption peak at the SSPPs’ cutoff frequency. Specifically, by utilizing the dependence of the SSPPs’ phase on the periodic unit, a constant π phase difference is formed at the cutoff frequency through the periodic unit number difference between the two paths, resulting in a cutoff frequency absorption peak. When the sample is coated on the SSPPs’ dual-path structure, the boundary conditions are altered, leading to a cutoff frequency shift, thereby enabling dielectric constant detection at the specified frequency. Simulation results show that, with proper structural design, the normalized characteristic frequency shift reaches 10.8%/εS and further demonstrates dramatic robustness against initial phase difference, sample thickness and sample loss. In summary, this work provides a novel high-precision and high-robustness method for detecting dielectric constant changes in samples at specified frequencies.
Zeng et al. (Fri,) studied this question.