Dielectric functions of common YBCO substrate materials determined by spectroscopic ellipsometry

Reference dielectric function data for several common YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) substrate materials have been determined by spectroscopic ellipsometry over the range 250 nm 750 nm. These materials include LaAlO/sub 3/, BaZrO/sub 3/, NdGaO/sub 3/, 9.5 mol% Y/sub 2/O/sub 3/-ZrO/sub 2/ (YSZ), LaSrGaO/sub 4/ (LSGO), and (LaAlO/sub 3/)/sub 0.3/-(Sr/sub 2/AlTaO/sub 6/)/sub 0.7/ (LSAT). The precision of the data was confirmed by comparing SE determined data for SrTiO/sub 3/ to published values, Agreement to the third decimal point was shown. These data have been used to characterize interfaces between YBCO and some of these materials by SE.