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March 24, 2009IEEE Transactions on Electron Devices

Reliability Impact of Chalcogenide-Structure Relaxation in Phase-Change Memory (PCM) Cells—Part I: Experimental Study

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DIDaniele IelminiConsorzio di Bioingegneria e Informatica MedicaDSD. K. SharmaChaudhary Charan Singh UniversitySLSimone LavizzariIMEC

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Ielmini et al. (2009) studied this question.

synapsesocial.com/papers/6a00008a64548b97a42d79afhttps://doi.org/10.1109/ted.2009.2016397
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