Thickness-dependent electrical characteristics of lead zirconate titanate thin films

Ferroelectric lead zirconate titanate thin films of morphotropic phase boundary composition were fabricated through the sol-gel spin-on technique to study the thickness dependence of electrical characteristics. At saturation, the films exhibited a dielectric constant of 1300, dissipation factor of 0.03, Curie temperature of 366 °C, remanent polarization of 36 μC/cm2, coercivity of around 30 kV/cm, and dielectric breakdown strength of over 1 MV/cm. The temperature dependence of permittivity showed an anomalous behavior with annealing temperature. The high temperature dielectric behavior of the films were distinguished by smeared and stunted dielectric maximum.