IMD—Software for modeling the optical properties of multilayer films

A computer program called IMD is described. IMD is used for modeling the optical properties (reflectance, transmittance, electric-field intensities, etc.) of multilayer films, i.e., films consisting of any number of layers of any thickness. IMD includes a full graphical user interface and affords modeling with up to eight simultaneous independent variables, as well as parameter estimation (including confidence interval generation) using nonlinear, least-squares curve fitting to user-supplied experimental optical data. The computation methods and user interface are described, and numerous examples are presented that illustrate some of IMD’s unique modeling, fitting, and visualization capabilities.