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In this work, Pb0.97La0.02(Zr0.98Ti0.02)O3 (PLZT 2/98/2) antiferroelectric (AFE) thick films were successfully deposited on LaNiO3/Si(100) substrates by polyvinylpyrrolidone (PVP)-modified chemical solution. Each wet layer was first dried at 300 °C and then pyrolyzed at higher temperature B of 600, 650, or 700 °C, respectively. The effects of the pyrolyzed temperature B on the microstructure and the energy-storage performance of the AFE films were investigated in detail. As the increasing of the pyrolyzed temperature, the crystallized PLZT 2/98/2 films displayed a more uniform and dense surface microstructure. As a result, the dielectric properties, AFE characterization, and energy-storage performance were remarkably improved for the AFE thick films pyrolyzed at higher temperature. The maximum energy-storage density of 58.1 J/cm3 and the corresponding energy-storage efficiency of 37.3% were obtained in the PLZT 2/98/2 films pyrolyzed at 700 °C for every layer.
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Wang et al. (2012) studied this question.
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