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April 1, 1997Integrated ferroelectrics

Capacitor test simulation of retention and imprint characteristics for ferroelectric memory operation

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Authors

STS. D. TraynorEltron ResearchTHT. D. HadnagyEltron ResearchLKL. KammerdinerCOI Ceramics (United States)

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Traynor et al. (1997) studied this question.

synapsesocial.com/papers/6a02e71a67f6ea5cc8756cf9https://doi.org/10.1080/10584589708013030
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