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October 13, 2016IEEE Transactions on Device and Materials ReliabilityOpen Access

A Review of Raman Thermography for Electronic and Opto-Electronic Device Measurement With Submicron Spatial and Nanosecond Temporal Resolution

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MKMartin KuballUniversity of BristolJPJames W. PomeroyUniversity of Bristol

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Kuball et al. (2016) studied this question.

synapsesocial.com/papers/6a036870f32c10a08381ebc3https://doi.org/10.1109/tdmr.2016.2617458
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