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Ideal curves of MOS capacity and surface potential are computed for silicon with oxide thickness and doping as a parameter. High-frequency and low-frequency capacity curves are presented for the doping ranges between 1 × 10 14 and 1 × 10 17 cm −3 and SiO <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> thickness between 100 and 12000 Å. Additional curves give flatband capacitance, minimum capacitance and voltage of the minimum capacitance in the same ranges. ∗
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A. Goetzberger (1966) studied this question.
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