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To investigate the phosphorescence and structural characteristics of a tetrameric copper(I)−amide cluster.

Phosphorescence and Structure of a Tetrameric Copper(I)−Amide Cluster

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To investigate the phosphorescence and structural characteristics of a tetrameric copper(I)−amide cluster.
Synthesized colorless copper(I) cluster [CuN(Si(CH(3))(3))(2)](4) analyzed using electronic absorption and luminescence spectroscopy.
Conducted X-ray crystallography at 130 K and 296 K to determine crystal structure and symmetry.
Assessed chemical vapor deposition (CVD) performance at varying substrate temperatures.
Observed phosphorescence in CH(2)Cl(2) with max emission of 512 nm and lifetime of 30 µs.
X-ray analysis confirmed primitive lattice structure P2/n with Cu-N distances of 1.917-1.925 Å.
CVD of copper metal demonstrated photochemical enhancement, depositing films at temperatures as low as 145 °C.

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Randomized trial demonstrates phosphorescence properties in a tetrameric copper(I) cluster, suggesting potential industrial applications.

James et al. (1998) studied this question.

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