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August 1, 1998Annual Review of Materials Science

Imaging and Control of Domain Structures in Ferroelectric Thin Films via Scanning Force Microscopy

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Authors

AGAlexei GruvermanUniversity of Nebraska–LincolnOAOrlando AucielloThe University of Texas at DallasHTHiroshi TokumotoHiroshima University

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Gruverman et al. (1998) studied this question.

synapsesocial.com/papers/6a0ccd2c6d2ea0967e4a475dhttps://doi.org/10.1146/annurev.matsci.28.1.101
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