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May 20, 2026IUCrJOpen Access

High-throughput inclined scanning three-dimensional X-ray diffraction microscopy via dual line–beam X-point scanning

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Randomized trial demonstrates improved scanning efficiency in crystal orientation mapping, suggesting enhanced practical use.

This work aims to improve the efficiency of inclined scanning three-dimensional X-ray diffraction microscopy for crystal orientation mapping.
Introduced a dual line-beam X-point scanning mode, reducing the number of scans from 51 × 37 to 51 + 37.
Conducted pixel-wise multiplication of two diffraction images to enhance diffraction peak visibility.
Performed multigrain indexing to validate the orientation mapping efficiency against traditional methods.
Achieved a 21-fold reduction in scan numbers with dual line-beam scanning.
Orientation maps from DLX scanning closely matched those from conventional methods, confirming its effectiveness.
Demonstrated significant time efficiency improvements in the scanning process.

Kim et al. (2026) studied this question.

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