The thermal reduction method provides a simpler, safer, and more economical alternative for reducing graphene oxide. In this study, we performed GO reduction via thermal reduction under ambient conditions. The reduction temperature plays the most crucial role, as it controls the quality of reduced graphene oxide, including carbon content and lattice defects. This study achieved the highest content with the fewest defects in the graphene lattice at an optimum temperature of 500 °C. GO reduction using the thermal method in ambient atmosphere has been done. The XRD diffractogram produces a peak at 2θ = 26°. Raman spectra show the ID/IG ratio is 1.00. SEM images exhibit an open-layer morphology with distinct folds and high porosity. The component ratios, as determined by EDS spectra, show a C/O ratio of 4.05. TEM images display many folds and stacks of thick sheets. The produced defects are flat sheets with a low defect level. Electrochemical performance produces a CV curve forming quasi-rectangular shapes. Capacitance retention with current 1 A/g is 213 F/g. Electrochemical performance in a two-electrode system shows capacity retention of up to 80% over 10,000 cycles.
Amrulloh et al. (Mon,) studied this question.