Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
December 15, 1983Physical review. B, Condensed matter

de Haas—van Alphen effect in silicon inversion layers

View Full Paper
Ask AI
Bookmark
Share

Authors

FFF. F. FangIBM (United States)PSP. J. StilesNorth Carolina State University

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Fang et al. (1983) studied this question.

synapsesocial.com/papers/6a10ec0639dd87f6d0ee9122https://doi.org/10.1103/physrevb.28.6992
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Observation of the deHaas–van Alphen effect in a two-dimensional electron system1983 · 76 citations
  2. 2New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall Resistance1980 · 7,122 citations
  3. 3Quantized magnetoresistance in two-dimensional electron systems1983 · 69 citations
  4. 4Electronic properties of two-dimensional systems1982 · 7,461 citations