Tunable Replica Bits for Dynamic Variation Tolerance in 8T SRAM Arrays

Infrequent dynamic events like V CC droops and temperature changes result in the use of a static V CC guardband in 8T SRAM arrays. This paper proposes the use of tunable replica bits (TRBs) as a potential solution to mitigating a part of the V CC guardband. Measured data on a 16 KB 8T array featuring tun able replica bits illustrate 9% reduction of the operating minimum V CC (V MIN ) and correspondingly a 7.5% reduction in array power.