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Time-Domain Reflectometry (TDR) is a well-well known technique, widely used in several fields, such as signal integrity and remote sensing. Here we show that TDR can be conveniently used in the Near-Field Scanning Microwave Microscopy, regardless the apparent mismatch between timescales involved at nanoscale and the period of a microwave signal. The technique is demonstrated on Highly Oriented Pyrolitic Graphite (HOPG) and CVD graphene.
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Farina et al. (2015) studied this question.
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