Answers are grounded in this paper and cite their sources.
We present an analysis of a spatial carrier-fringe pattern in three-dimensional (3-D) shape measurement by using the wavelet transform, a tool excelling for its multiresolution in the time- and space-frequency domains. To overcome the limitation of the Fourier transform, we introduce the Gabor wavelet to analyze the phase distributions of the spatial carrier-fringe pattern. The theory of wavelet transform profilometry, an accuracy check by means of a simulation, and an example of 3-D shape measurement are shown.
No takes yet. Share an insight, caveat, or question.
Zhong et al. (2004) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: