Defining SRAM resistive defects and their simulation stimuli

This paper presents a structured way of deriving new functional fault models, based on the insertion of resistive defects into the electrical schematic of an SRAM. A taxonomy of the set of possible electrical faults is given, a set of primitive patterns to drive the electrical level simulator is derived, the existing notation for functional faults is revisited, and simulation results prove the existence of new functional faults.