Memristor-Based Read–Write Interface Design for Neural Networks: A Comparative Study of Linear-Drift and VTEAM Models

This paper presents a behavioral-level, pre-silicon analytical co-design framework for memristor read–write interfaces, intended to establish closed-form design rules that subsequently guide SPICE-level and silicon-level realizations. Memristor-based neural hardware requires interfaces that can program resistance states efficiently while suppressing read disturbance, yet existing designs typically rely on empirical tuning without closed-form analytical rules. We close this gap by deriving a single closed-form operating-window inequality (von<Vrd<voff,Vwr≥Vwrmin(Twr)) from the VTEAM state equation, embedding it in an Energy–Delay–Accuracy (EDA) cost function, and validating the resulting parameter set hierarchically up to MNIST-scale inference. The main finding is that this analytically derived parameter set simultaneously achieves a 96.08% set-cycle energy saving and 90.6% MNIST top-1 accuracy (1.2% below software baseline) under realistic D2D/C2C variability, with every measured number agreeing with its analytical prediction within 2%. The framework is instantiated with a two-phase over-threshold-write and sub-threshold-read timing strategy together with a mutually exclusive PMOS-NMOS path-isolation topology, evaluated through behavioral-level MATLAB simulation under linear-drift and VTEAM models. Behavioral simulation confirms each analytical bound within 2%: a 13.78× resistance window with ≤0.008% cycle-to-cycle drift, 5.01% read-current CV, and 30.94%/96.08% Reset/Set energy savings versus a no-separation baseline. Transistor-level non-idealities (slew rate, charge injection, RTN, retention aging, peripheral overhead) are bounded analytically; full SPICE/silicon validation is identified as immediate follow-up work. These results establish a reusable, analytically grounded reference design that bridges memristive device modeling, circuit-level interface implementation, and neural network-level usability.