RAM testing algorithms for detection multiple linked faults

Many fault models for RAMs and tests for faults of these models are available. In most cases these tests allow for the detection of single faults only. This paper contains fault coverage analysis of march tests which detect multiple faults. It is shown there are faults which are not detected by any of the existing march tests. So we propose new test algorithms which cover multiple faults and are particularly effective for detecting linked faults while, at the same time, having short test time.