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September 2, 2010Advanced Materials

Surface Wrinkling: A Versatile Platform for Measuring Thin‐Film Properties

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Authors

JCJun Young ChungAjou UniversityANAdam J. NolteNational Institute of Standards and TechnologyCSChristopher M. StaffordNational Institute of Standards and Technology

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Cite This Study

Chung et al. (2010) studied this question.

synapsesocial.com/papers/6a1bd464c97d63156a5effdehttps://doi.org/10.1002/adma.201001759
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