We have used interfacial force microscopy (IFM) to monitor the mechanical deformation of single nanometer-size grains in Au thin films. Our results show that protruding grains, which represent early-stage delamination, display multiple deformation mechanisms including grain-boundary sliding and intragranular plasticity. The unprecedented load-displacement control capability of the IFM provides data that are used for the first time to quantitatively distinguish and evaluate individual deformation processes.
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Tangyunyong et al. (1993) studied this question.
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