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We report an extended X-ray fine structure (EXAFS) analysis of the type-I clathrates Ba₈Ga₁₆X₃₀ (X = Si, Sn) and compare the results with the results of previous studies on X = Ge. The environment about Ba is the most disordered for X=Sn.
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Keiber et al. (2015) studied this question.
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