Determination of the Temperature Dependent Thermal Expansion Coefficients of Bulk AlN by HRXRD

We measured the lattice constants of bulk aluminum nitride crystals at various temperatures by high resolution X-ray diffraction. By the use of a high temperature chamber and a X-ray cryostat a temperature regime from 20 to 1210 K was available. Furthermore, the measured data were fitted by Einstein-and Debye models which yield reliable parameters for the calculation of the thermal expansion coefficients of AlN.