March 1, 1974IEEE Transactions on Microwave Theory and Techniques

Computation of Dielectric Properties from Short-Circuited Waveguide Measurements on High- or Low-Loss Materials (Computer Program Descriptions)

View Full Paper

Ask AI

Bookmark

Abstract

Computation of the relative complex permittivity components /spl epsilon//sub r/' and /spl epsilon//sub r/'' loss tangent, and conductivity from measurements data on materials in coaxial, rectangular, or cylindrical waveguides.

Discussion

No takes yet. Share an insight, caveat, or question.

Cite This Study

Nelson et al. (1974) studied this question.

synapsesocial.com/papers/6a1d6cb6266863fda62f3fda https://doi.org/10.1109/tmtt.1974.1128224

View Full Paper

Ask AI

Bookmark

Computation of Dielectric Properties from Short-Circuited Waveguide Measurements on High- or Low-Loss Materials (Computer Program Descriptions)

Abstract

Discussion

Cite This Study

Computation of Dielectric Properties from Short-Circuited Waveguide Measurements on High- or Low-Loss Materials (Computer Program Descriptions)

Abstract

Discussion

Cite This Study

Keep reading

Keep reading