The application of a computer program, SEMM (Soft-Error Monte Carlo Modeling), is described. SEMM calculates the soft-error rate (SER) of semiconductor chips due to ionizing radiation. Used primarily to determine whether chip designs meet SER specifications, the program requires detailed layout and process information and circuit Q <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">crit</inf> values.
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Murley et al. (1996) studied this question.
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