Answers are grounded in this paper and cite their sources.
A detailed study of energy‐dispersive X‐ray spectra is undertaken. Considerable attention is given to a method for a systematic and accurate description of the K and L spectra; a digital correction for the peak profile is evaluated. The following second order effects and spectral artefacts are investigated: radiative Auger transitions, spectral background components, Raman scattering of X‐rays, silicon escape, fluorescence of the detector materials, and sum peaks.
No takes yet. Share an insight, caveat, or question.
Espen et al. (1980) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: