Simulations of surface roughness effects in planar superlenses

The impact of interfacial surface roughness upon imaging characteristics in planar superlenses has been investigated using finite element method (FEM) modelling. Simulations have been performed across the surface roughness range of 0.1?1.5?nm root mean square (RMS) for single-?and dual-layer superlenses. For single-layer superlenses the influence of asymmetric surface roughness profiles has also been investigated. Modelling results suggest a positive linear relationship between surface roughness, on the lens interfaces, and line edge roughness in the resulting image. Dual-layer superlenses are observed to be more sensitive to the magnitude of interfacial surface roughness than single-layer superlenses. Results from asymmetric roughness profiles indicate that imaging characteristics of planar superlenses are independent of which interface the roughness is concentrated on.