Simultaneous in situ real-time measurements of x-ray reflectivity and differential reflectance spectroscopy were conducted during deposition of perfluorinated copper-phthalocyanine thin films on SiO2/Si. We found a continuous spectral change coinciding with structural changes from submonolayer coverage, to standing βbilayer-phase and to β-phase for thicker films. This combined measurement enables us to study the relationship between structural and optical properties of organic semiconductor thin films.
No takes yet. Share an insight, caveat, or question.
Hosokai et al. (2010) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: