Answers are grounded in this paper and cite their sources.
Time-of-flight secondary ion mass spectrometry is a widely used surface analytical technique, which can provide chemical information from both the uppermost surface and underneath the surface for various materials.
No takes yet. Share an insight, caveat, or question.
Zhou et al. (2018) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: