Calibration method to improve the accuracy of THz imaging and spectroscopy in reflection geometry

We introduce a novel method to accurately extract the optical parameters in terahertz reflection imaging. Our method builds on standard self-referencing methods using the reflected signal from the bottom of the imaging window material to further compensate for time-dependent system fluctuations and position-dependent variation in the window thickness. Our proposed method not only improves the accuracy, but also simplifies the imaging procedure and reduces measurement times.