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The L and M X-ray emission bands of metallic copper are calculated in the one-electron approximation using augmented plane wave Bloch functions analysed into s, p and d symmetry components. The effect on the calculated intensity distributions of lifetime broadening due to Auger processes is estimated in a simple manner, and appropriately broadened curves are compared with the available experimental data.
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Goodings et al. (1969) studied this question.
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