Effects of mechanical strain on amorphous silicon thin-film transistor electrical stability

Melissa Chow; Arash A. Fomani; Maryam Moradi; G. Reza Chaji; R. Lujan; William S. Wong

doi:10.1063/1.4811271

June 10, 2013Applied Physics Letters

Effects of mechanical strain on amorphous silicon thin-film transistor electrical stability

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Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation M. J. Chow, A. A. Fomani, M. Moradi, G. Chaji, R. A. Lujan, W. S. Wong; Effects of mechanical strain on amorphous silicon thin-film transistor electrical stability. Appl. Phys. Lett. 10 June 2013; 102 (23): 233509. https://doi.org/10.1063/1.4811271 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search

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synapsesocial.com/papers/6a209cf6a0a6a0a25691cd05 https://doi.org/10.1063/1.4811271

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Effects of mechanical strain on amorphous silicon thin-film transistor electrical stability

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